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Multi-scale Imaging and Materials Analysis

Materials characterization is essential for designing new materials and ensuring quality before industrial production. Our state-of-the-art instruments can analyze your materials down to the atomic level, providing the precision you need.

We offer:

  • Environmental Transmission Electron Microscopy (ETEM): Investigate fluid-solid interactions and structural details with atomic resolution.
  • FIB-SEM 3D Imaging: Achieve exceptional 1 nm resolution for detailed 3D imaging of your materials.
  • Nondestructive 3D Micro-CT Imaging: Examine internal structures and porosity at resolutions down to 800 nm without damaging your samples.
  • Nondestructive 3D Macro-CT Imaging: Identify material boundaries, evaluate fracture behavior, and assess orientation with resolutions down to 100 um.

We also possess proprietary and protected platforms developed specifically for the analysis of nanoporous materials, which can be utilized for various scientific and engineering applications, such as testing and developing hydrogen storage cells.

Contact us today to discuss how our advanced characterization capabilities can elevate your research and development efforts!

High resolution TEM image of ordered silica. Individual silicon atoms may be distinguished
SEM image of ferrous nanoparticles precipitated on a carbon film